l mil.s.19500/24d 18 march 1970 superseding mi l-s.19500/24c 14 may 1963 military specification i semiconductor device, transistor, pnp, germanium, power type 2n 158 this specifimticm is mandatory for use by .11 oc- partmenls nnd/lgcncics of the department of dcfensc. 1. scope 1.1 scope. this specification covers the detail rcquirermnts for a pnp, germanium, power transistor, 1.2 physicaf dimetions. see figure 1. 1.3 maximum ratings. 3eeeee ~ derntc linearly 0.283 w~c {or ta >25? c. 1.4 primary electrical characteristics. 2. applicable documents 2.1 the following documents, of the issue in effect on date of invitation for bids or request for propowd, form a pnrt of the specification to the extent specified herein. specification milftary }il l-s-l 9500. %nicond?.tor devices, gcmral sp.mificntio? for, fsc 5961
. . . . . . . . . . . . . . $.? l-a. ,ymlu, . . ? standard ?, olitary? ?jii,.std .750 tc.qt vt.th.ds for !jernimnduct.r dwiccs. (copim of specifications, ~tmdards, drawir~s, and publication. required by suppliers in c.nmction with specific proc.rernenl functions should k. obtained from the procuring .cti\ity or m direcwt by tbc contracting 011,..,,) 3. requirements 3.1 ge.mnl. i{cquircmmts shall be i. mi.rda.w wilh !iil-s.19500, and .s .pccifiml hcrci., 3.2 abbreviations, syrnbofs, md de finitimm ?flw abbrrvialions, symbols, and definitions used herein arc defined in mil-s. 19500. 3.3 design, construction, z.d pbysicat dimensions. trm,t.lots shc.tf be .[ tbe design, w.structim, and physical dimnsi.n. how. on figure 1. 3.4 performance chamcteristicm prrformancr .itaravtmistims a h o be .s specified in tablm 1,11, and 01. 3.5 marking. ttw following marking ,p.ci lied in nil-s. 19s00 may ix omit ~.d from tbe body of & transi40r at the optiw of th, rmnufmt.rm: (.) country ./ origin. (b) nmm(.cturcr?s idcrttification. 4. quality assurance provisions 4.1 sampling and inspcctio.. sompti.g and inspection shall ht. in accordance wiib 3! il.s. 19,500, and m specifi~?d b~r?in. 4.2 qu.difimtio. impectio.. qu.lificati.. i.sp-.ti.n shall ,romis t .1 the ex.mirmti.m and t..sls tiprcificd in tables 1, 0, md 10. 4.3 quality ccmformance inspection. qtmlity wmforrnmrc i.,pmlim .hafl c.rwist of group a, b, and c inspection. 4.3.1 croup .1 hsp.cf ion. group a in,pc.t ion shall consist of ttw cx.tninali..s a?d twts spmified i. bible 1. 4.3.? croup b in~pcction. gcoiip b iw~?~ti.rl 51330 ruvl+t of lhc r~amirlation~ and m, specified in tabl. u. 4.3.3 group c fn$pc~tion. croup c iw~~ti.:1 .hao rlsi*i ~~f ih(? t?xaminati~na a:ld t=!a specified in table 01, thu inspection hall b,, cmducted on 11,,, initi.1 1.( nml thm,afler ,wty 6 months during production. 4.3.4 group b md group c iifc-tmt wmplm. %mpbw that haw bccu mbjcctcd t. ~o.p b, 340.ho.r ii f..tmt, may be mnt inwd on lw1 to 1,000 ito.m i? ,,rd.r to satisfy grtmp c fife-fcst rqukcmmts. tbex mtnpl.s .hdl b. prrdwignat.d, .nd shafl rcmair, mbjccted t{, the grmp c 1.bbo-h..r acc.ptmnce wahmtion after they have p.sncd lb. group d. 340.hmr ..wpt..cc criteria, the c.rn.lali.c total .f failtme~ found during 340.ho.r test and during the s.b,wq.ml i?tcmnl up to 1000 hours mhall be computed for 1,mto.ho.r .cceptance criicrim (m. 4.3.3). 4.4 meoioda of examination md id. methods of .xwnimti.. and test shalt be as tipccikd in tablm i, o, md 01. 2 l
tkslrs.19500124d l i ?o 5. preparation for delivery 5.1 s.. nil-s-1 9500, sect ion 5. 6. notf.s: 6.1 notes. l%. notes specified in ml l..% i95oo am applicable to this specificalicm. wmf&iik pre@rihg activity ?&fhy .h nkvy ec navy - ec ar force. 85 agent: usa es re$iew aclivitim: army mu, ml (project 5961.0156) navy - sh akfome. 11, 17 dsa ss user .nctivities: army sm navy cc, hlc, os, as air force -13,15, 19,70,80 7
, i owa17weht of the imvv i naval -tw3nic swrms comand ,0,,,, s ,,, v,,, ..1. ?,?? ocp,, t?c? t wassing3tin, d. c. 203f@ i official wsiiiss cdfmander naval blsctronic systsmb command defense stanuardi.z4t ion prccbam bbaiwh depahtmbw2 of the navy wassincmn , d. c. 20360 l fold . l
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